Development of a soft X-ray angle-resolved photoemission system applicable to 100 µm crystals

نویسندگان

  • Takayuki Muro
  • Yukako Kato
  • Tomohiro Matsushita
  • Toyohiko Kinoshita
  • Yoshio Watanabe
  • Hiroyuki Okazaki
  • Takayoshi Yokoya
  • Akira Sekiyama
  • Shigemasa Suga
چکیده

A system for angle-resolved photoemission spectroscopy (ARPES) of small single crystals with sizes down to 100 µm has been developed. Soft X-ray synchrotron radiation with a spot size of ∼40 µm × 65 µm at the sample position is used for the excitation. Using this system an ARPES measurement has been performed on a Si crystal of size 120 µm × 100 µm × 80 µm. The crystal was properly oriented on a sample stage by measuring the Laue spots. The crystal was cleaved in situ with a microcleaver at 100 K. The cleaved surface was adjusted to the beam spot using an optical microscope. Consequently, clear band dispersions along the Γ-X direction reflecting the bulk electronic states were observed with a photon energy of 879 eV.

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عنوان ژورنال:

دوره 18  شماره 

صفحات  -

تاریخ انتشار 2011